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ABSTRACT
Repetitive aerial photography can be used to help identify and evaluate variation within soil mapping units. An area of approximately 12 ha (30 acres) was photographed from a light plane with two 35-mm cameras using color and color infrared film on 20 different dates from May through November 1969. This sequence of aerial photographs recorded changes in surface soil moisture patterns and documented a close correlation to patterns of differences in growth and maturation of corn (Zea mays L.) that were visible later on during the growing season.
Field investigation of soil profiles in the study area established the relationship of these patterns of surficial soil moisture and crop growth to variations in soil profile characteristics, especially depth of solum, thickness of silt mantle and soil drainage class. The yield of ear corn associated with delineated areas of crop and soil patterns ranged from 5,865 to 9,087 kg/ha. Differences in crop growth and yield were attributed to variations in the amount of available soil moisture, as influenced by soil profile characteristics and surface topography.
1 Research supported in part by the Univ. of Wisconsin, Madison, WI 53706, with funds from NASA Multidisciplinary Research Grant in Space Science and Engineering, Grant No. NGL 50-022-127. Presented before Div. S-5, Soil Sci. Soc. Am., Tucson, Arizona, 25 Aug., 1970.
2 Associate Professor of Natural Resources and Geography/Geology, Univ. of Wisconsin-Stevens Point, and Professor of Civil and Environmental Engineering, Univ. of Wisconsin-Madison; respectively.
Received for publication March 17, 1976. Accepted for publication March 23, 1976.
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